Archive for July, 2009
XJTAG Support Website
27 July, 2009
This post explores the wealth of information available on the XJTAG Support Webpage.
Knowledge Base
Answers to common questions we receive about XJTAG. Before contacting support it is a good idea to check here first to see if your question is answered. There will be future posts exploring some of these questions in more detail.
Netlist Explorer
20 July, 2009
This post details the Netlist Explorer in XJDeveloper, a very useful tool in XJDeveloper for finding out how things are connected in the netlist. It also shows relevant properties for each item.
Launching the explorer
Currently the Netlist Explorer is a modal dialog which means you have to close it before you can use the rest of XJDeveloper. We hope to remove this restriction in a future release. You can launch the Netlist Explorer from most screens in Developer. All relevant toolbars have an “Explore” button, and right-clicking on items in controls will display a drop-down menu with an “Explore” button as well.
New Application Note available
15 July, 2009
There is a new application note available on the XJTAG support website entitled, “Working with configured Xilinx and Altera devices”.
Pull Resistors
13 July, 2009
Many of us have been designing electronics for years and haven’t really considered pull up and down resistor values. We just use the same old values like 10K. With some new silicon the leakage currents are higher than we have been used too. This means the pull resistors might not being doing the task we require. When there is a need to reduce power consumption, again these values need to be looked at in greater detail. XJTAG often finds resistors on boards that don’t actually perform the task intended.
Functional Tests
6 July, 2009
This post highlights the “Functional Tests” screen in XJDeveloper.
The “Functional Tests” screen is in the “Design For Test” section in XJDeveloper. It is used to indicate to XJTAG that part of a board has been tested in some way outside of XJTAG. Doing this will make the DFT test coverage figures more accurate, and means you can use XJTAG as the focal point for all your DFT analysis across all your test systems.