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XJTAG boundary scan solutions for the whole product lifecycle

Archive for October, 2009

Test Modes in XJRunner – part 1

26 October, 2009

If you have multiple XJLinks plugged into your machine, the main testing screen of XJRunner enables you to test multiple boards simultaneously. From XJTAG version 2.3 we have increased the flexibility of this by introducing two different test modes. This post highlights Group modeIndependent mode will be covered in a future post.

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By Tina Chremmou on 26 October, 2009  |  comments  Comments (1)

Filed under: XJRunner  |  Tags:

Categories for selectors in XJDeveloper – part 2

19 October, 2009

Part 1 of this series explained how to add or edit the categories for the selectors in XJDeveloper.

This entry will focus on using BOM (Bill of Materials) information in the selectors, using the demonstration board that comes with the XJTAG development system as an example.

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By John Barton on 19 October, 2009  |  comments  Leave a comment

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Collecting user input from XJEase

9 October, 2009

A customer recently asked how to read some input from the user in XJEase. The next major release of XJTAG (probably numbered 2.4) will contain a new XJEase function INPUTBOX that makes doing this much simpler. In the meantime, I thought I might outline some code that accomplishes the same thing in the current version.

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By John Hall on 9 October, 2009  |  comments  Leave a comment

Filed under: XJEase  |  Tags:

Integrating XJTAG with other Test Systems – DFT

5 October, 2009

This series of posts will cover how you can integrate XJTAG into your overall test system.

This post is a quick reminder that you can use XJTAG as the focal point for your DFT analysis across all your test systems.

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By John Barton on 5 October, 2009  |  comments  Leave a comment

Filed under: Board Design, XJDeveloper  |  Tags: ,