XJTAG Blog

 
XJTAG boundary scan solutions for the whole product lifecycle

Archive for September, 2010

Using CONNECT vs PULL in PDD files

27 September, 2010

Why use CONNECT not PULL for low-value pull resistors? When a resistor is specified as a pull resistor the XJTAG system will expect two things: Read the rest of this entry »

By Bob Storey on 27 September, 2010  |  comments  Leave a comment

Filed under: XJDeveloper  |  Tags: , ,

XJTAG Boundary Scan Testing with OMAP 35xx devices

13 September, 2010

Texas Instruments’ OMAP processors are becoming more and more popular.  We have seen quite a few come through the office recently.

The good news is that the OMAP processors do support boundary scan testing. Read the rest of this entry »

By Bob Storey on 13 September, 2010  |  comments  Leave a comment

Filed under: Board Design,Electronics Tips,Support  |  Tags:

Debugging faults: always remember XJAnalyser!

6 September, 2010

The traditional technique for debugging printed circuit boards is to “observe” the state using oscilloscopes or multi-meters and deduce a fault. This method actually suppresses a very powerful engineering instinct that would help us a lot if we could only give it a better chance. Read the rest of this entry »

By Bob Storey on 6 September, 2010  |  comments  Leave a comment