Design for Test Analysis in XJDeveloper 2.4 – Part 2
This post introduces the new DFT reports which are generated from the DFT analysis data. This is a feature introduced in XJTAG version 2.4. […]
This post introduces the new DFT reports which are generated from the DFT analysis data. This is a feature introduced in XJTAG version 2.4. […]
In the XJTAG application note “Working with configured Xilinx and Altera devices” the point is made that the way to get the best test coverage is to test with blank devices. Blanking a device has its own challenges – […]