Types of reports you can generate

• Analysis by Circuit Element
  This report contains statistics for elements in the circuit. These can either be the entire circuit or for groups of elements such as boards, devices or nets. It can also provide detailed test coverage for each pin.
• Analysis by Coverage Type
  This report produces board level lists of individual pins according to whether or not they are covered for specific types of test coverage.
• Test Point Reduction
  Having test points on nets where good test coverage can be achieved with XJTAG is not necessary and uses up board space. This report lists these nets and suggests elimination of the test points where appropriate.
• Test Point Suggestion
  It is possible that test coverage on some nets could be improved by adding a test point. This report suggests nets where the designer might consider adding them.

Generating DFT Reports

DFT reports can be generated without having to go to the DFT screen: the Reports wizard can be launched from the Reports button in the Tools menu from anywhere in XJDeveloper. If you are on the DFT screen you can also launch the Reports wizard by clicking the corresponding button at the bottom of the circuit elements list.

Note that the filter options set on the Reports wizard are independent from the ones on the DFT Analysis screen; any filter options used on the DFT Analysis screen to narrow down data have no effect on the generated reports.

• There is a new improved circuit elements list which shows the element’s name along with all the calculated test coverage in adjacent sortable columns, that can be shown or hidden, so you can easily explore the results of the DFT analysis.

• The DFT Analysis screen features new improved charts with a modern and professional look; figures, percentages and graphical representation of the DFT analysis data are now displayed in a concise form, so with one glance you can see an overview of the test coverage of your circuit, or of individual circuit elements or groups of elements.

• There are improved filtering options to enable you to narrow down the display to the data of interest and focus on untested sections of your circuit.

The above features are displayed on “dockable” panels allowing you to set up your own preferred configuration of the DFT Analysis screen for maximum efficiency.

If logging is enabled, one or more log files will be generated whenever tests are run.

The Log File Viewer lists in the Explorer panel all the log files that have been generated during this session. Clicking on an item in the Explorer panel will open this file in a tabbed window. You can search through the text, print it or copy it to the windows clipboard for pasting into other applications. All windows, including the explorer pane, are dockable, so the interface can be customised to suit your needs.

The Log File Viewer can handle multiple files, each of size up to 100 MB. Other files, for example old log files, can also be opened; however, these will be listed in the explorer only as long as the Log File Viewer dialogue is open.

Independent mode

This can be quickly distinguished from Group Mode by the fact that the tabs corresponding to the plugged in XJLinks do not have checkboxes. In this mode the XJLinks operate independently. Clicking the Run/Stop buttons will start/stop tests only on the XJLink the tab of which is currently selected. You can run tests on a different XJLink by selecting its tab and then clicking the Run button; the tests will run on this unit independently of whether tests are running on other units. Note that if you have an XJLink2, you can run tests on it by pressing the  Run button on the XJLink2 unit without having to select its tab first.

If a new XJLink is plugged into your machine while tests are running, it will get its own tab on the main testing screen and you can start tests on it immediately. Once testing has finished it can again be started independently of the other units.

In this mode, serial numbers are entered separately for each board on the pop-up dialogue when testing begins on this XJLink. When testing finishes on an XJLink, the pop-up window at the end will show results only for this board.

Cumulative test results analysis

A very useful feature of this mode is the ability to show cumulative total results of the tests which have been run. If Tools -> Counting is enabled, the counters of the summary pane at the bottom of the screen will show how many boards have passed, failed, are currently running tests or have had testing stopped during the current session.

A more detailed statistical analysis of the cumulative test results can be seen on the Analysis dialogue, which can be launched by clicking the View Totals button on the main toolbar. The Board Statistics tab shows you numbers and percentages of the boards that fall into each category of results (Passed, Failed, Stopped) along with their serial numbers and the user comments (if any).

The Fault Trend Analysis tab gives you the total number of the test functions that have passed/failed on all of the tested boards, i.e. you can view the most common test failures and identify the most problematic bits of your system or weak parts of your test code.

If you want to exclude boards from the statistics and run tests without altering the cumulative tests results, for example when debugging a board, you can pause counting by pressing the Counting button. Counting can be resumed by pressing the button again. The cumulative test results can be reset at any time by clicking the Reset Counters button on the main toolbar.

Group mode

In this mode the XJLinks operate as a group. You can select which units to run tests on by ticking the checkboxes on the corresponding tabs. Clicking the Run button on the screen will start tests simultaneously on all of the selected XJLinks as a group. If there are XJLink2 units among the selected XJLinks, you can also start testing by pressing the Run button on any one of them. More tests can be run on all the units only after the whole group has finished or the Stop button has been pressed on-screen.

While tests are running, the XJLinks cannot be selected or deselected, and the tabs corresponding to non-selected XJLinks will remain disabled until tests finish or are stopped. If a new XJLink is plugged into your machine while tests are running, it will get its own tab on the main testing screen, however the tab will remain disabled until the group has finished.

If your project’s options require user entered serial numbers for the boards under test, these can be entered for the whole group on the pop-up dialogue at the beginning of testing. If the Runtime dialogues are enabled, the pop-up window at the end of testing will again show results for the whole group. Summary statistics for the currently running group are also shown at the bottom pane next to the Run/Stop buttons; these are reset when new tests start.