Using IIC to enable power supplies on your board

With the introduction of External Hardware per Subchain in XJDeveloper v3.9 it is possible to write a test that powers up your board using your XJLink2 to directly control the IIC pins before the JTAG chain is operable. Following is an example of how to set up this test in your project: [...]

2023-11-14T20:51:56+00:00By |Categories: Features, Other, Support, XJDeveloper, XJEase|Tags: , , , , |

External Hardware available per-Subchain (including testing without JTAG)

Version 3.9 of XJDeveloper introduces the ability to control which External Hardware machines operate in each Subchain, and integrates this control into the Dynamic Chains feature. This means that any test may now be configured to use just JTAG, just External Hardware, or a combination of both, to drive signals on the circuit under test. [...]

2019-07-12T14:42:56+01:00By |Categories: Features, Other, Support, XJDeveloper|Tags: , , |

XJEase Waveform Viewer in XJDeveloper

From XJTAG version 3.8, the XJEase debugger in XJDeveloper now comes with a Waveform View providing more information about the XJEase code being executed. The XJEase Waveform View is designed to show you what your tests actually did in a style similar to that of a logic analyser, however instead of the bottom axis representing [...]

Improve your printed circuit board test, debug and programming processes using XJTAG’s powerful boundary scan test suite. It can speed up your design and development, as well as providing excellent test coverage in production.
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