‘Dynamic Chains’ is a term we’ve coined to describe a test system that has the ability to drive more that 1 JTAG chain configuration. This may be possible if it has multiple chains driven by different TMS or TCK pins, or a single chain that has multiple JTAG device variations (for example using a Scan Bridge). Before v3.3, XJTAG projects could only represent a single static JTAG chain. With our new functionality, multiple JTAG chain variations can be defined, set up and run within a single XJTAG project in a single test run. […]
We recently had to support a customer who was unable to run XJTAG 3.1 on an older PC. It turned out that the processor in the PC in question did not support SSE2 instructions. During the development of v3.1 we upgraded the compiler we use to build XJTAG and it now uses these instructions to speed up execution. SSE2 instructions were introduced with the Pentium 4 in 2001 and were supported in AMD processors with their Opteron and Athlon 64 processors from 2003 onwards.
We have had several customers having problems exporting ODB++ jobs from PADS, where all the net information is lost. In the ODB++ Export dialog, ensure that “Neutralize nets” is unchecked. […]
One of the many netlist formats that XJTAG supports is EDIF 2, an open data exchange format that is widely supported. EDIF stores both netlist and schematic data, but XJTAG only uses the netlist data. It often seems like the obvious choice of format to export from your CAD tool to use in XJTAG. However, there are a number of problems that we have come across with EDIF netlists: […]
Texas Instruments’ OMAP processors are becoming more and more popular. We have seen quite a few come through the office recently. The good news is that the OMAP processors do support boundary scan testing. […]