Errors in Intel Agilex BSDL files

We have recently seen Agilex BSDL files that cause XJDeveloper to emit errors looking like this: The cause of this is a mismatch of information. Within the BSDL file, in the Advanced I/O description (AIO) section, there is a section that describes the pins' AC capabilities for IEEE 1149.6 testing. In this section each AC-capable [...]

2025-07-07T10:51:35+01:00By |Categories: Other, Support, XJDeveloper|Tags: , , , |

Custom cells in BSDL files

The JTAG standard contains definitions for various different types boundary scan cells, each of which have different capabilities, and these allow an IC vendor to accurately describe how the pins on their chips behave. But because not every eventuality can be foreseen the JTAG specification also allows IC vendors to create their own types of [...]

2023-11-14T20:51:58+00:00By |Categories: Support, XJDeveloper|Tags: , , , |
Improve your printed circuit board test, debug and programming processes using XJTAG’s powerful boundary scan test suite. It can speed up your design and development, as well as providing excellent test coverage in production.
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