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Test Summary Report

In XJTAG 3.7, XJDeveloper can now generate a new style of DFT report. The Test Summary Report can be found via the DFT Reports menu item within the Tools menu, or in the Reports menu on the DFT Analysis screen (as are the other DFT reports) and contains up to four sections: […]

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Setting the Rules for Suggesting Unfitted Devices

With XJDeveloper 3.7 the user now has more control over how unfitted devices are suggested. The Unfitted Rules Dialog allows for the specific suggestion methods to be enabled or disabled, allowing for more accurate unfitted device suggestions. […]

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More options for importing BOM information

The Bill of Materials, or BOM provides valuable information about the components in a netlist. This information is often key for project setups and, when available, is used by XJDeveloper to make project setup suggestions. This information is often taken from a separate BOM file or straight from a board’s netlist. With XJDeveloper 3.7 the volume of BOM data extracted for many of the netlist formats has increased. […]

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Automatic test list generation

From XJTAG 3.6 there is now a range of new options for generating the XJRunner test list automatically, to speed up project set-up time. […]

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New options for BOM importing

From XJDeveloper 3.6 a new BOM data type is available in the BOM Import dialog, the “Unfitted” device field. Any devices with an entry in a column assigned to this are suggested under the “Suggested Unfitted Devices” category on the Categorise Devices screen. […]

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An easier way to run SVF or STAPL files in XJTAG projects

There are new global functions in XJTAG 3.6 which are always available to use (like the built-in Connection Test). The functions RUNSTAPL and RUNSVF allow users to run programming files without having to write any further XJEase to enable this. […]

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Categorisation Suggestion Improvements

From XJTAG 3.6 onwards the suggested device categories on the Categorise Devices Screen have been renamed and expanded, with separate categories for different types of resistor packs. In addition, the “Suggested Resistors – Other” category now displays the reason for any resistor’s inclusion using a separate “Reason” column, to make the inclusion of a device into this category easier to understand. […]

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Custom cells in BSDL files

The JTAG standard contains definitions for various different types boundary scan cells, each of which have different capabilities, and these allow an IC vendor to accurately describe how the pins on their chips behave. But because not every eventuality can be foreseen the JTAG specification also allows IC vendors to create their own types of boundary scan cells.   […]

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Categorising devices: Ignore, Unfitted, or Uncategorised?

One of the questions we are commonly asked by new users, but also by users who have not used XJTAG for a while and are coming back to it, is about the differences between device categorisations in XJDeveloper. […]

Input parameters for test functions

Until now, XJRunner tests have been limited to functions which have no input arguments and a single return argument (which returns the result). XJTAG v3.5 relaxes that restriction, allowing input in XJRunner tests, though there is still a requirement to have a single return argument for the result. […]