Optimised Scans

Optimised scans is a new feature added to XJTAG 4.0 and it provides a number of improvements aimed at increasing test speed. With Optimised Scans enabled, every JTAG TAP will scan data through at a separate frequency based on the capabilities of the JTAG devices in that TAP group. […]

2024-06-03T16:49:49+01:00By |Categories: Features, XJDeveloper|Tags: , |
Improve your printed circuit board test, debug and programming processes using XJTAG’s powerful boundary scan test suite. It can speed up your design and development, as well as providing excellent test coverage in production.
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