XJTAG 3.11 introduces support for the ARM Serial Wire Debug (SWD) protocol in XJEase using our XJLink2-based JTAG controllers. Reading and writing with the SWD protocol is made simple using two new XJEase functions SWD_READ and SWD_WRITE. They handle the transfer of data on the bidirectional data connection, keeping the code in XJEase clean and [...]
A time-saving feature of XJTAG v3.10 is streamlined background compilation of projects, drastically reducing the startup time to run tests. […]
With the introduction of External Hardware per Subchain in XJDeveloper v3.9 it is possible to write a test that powers up your board using your XJLink2 to directly control the IIC pins before the JTAG chain is operable. Following is an example of how to set up this test in your project: [...]
Version 3.9 of XJDeveloper introduces the ability to control which External Hardware machines operate in each Subchain, and integrates this control into the Dynamic Chains feature. This means that any test may now be configured to use just JTAG, just External Hardware, or a combination of both, to drive signals on the circuit under test. [...]
Version 3.8.3 of XJTAG comes with some usability updates for the new XJEase Waveform Viewer. Tool tip information, event labels, and a context menu for pin navigation and source tracking has been added. […]
From XJTAG version 3.8, the XJEase debugger in XJDeveloper now comes with a Waveform View providing more information about the XJEase code being executed. The XJEase Waveform View is designed to show you what your tests actually did in a style similar to that of a logic analyser, however instead of the bottom axis representing [...]
From XJTAG version 3.6.0, you can store multiple variables of the same type in an array structure. Arrays are supported for the types INT, STRING and FILE. […]
From XJTAG version 3.6, the XJEase debugger in XJDeveloper now comes with a Call Stack window providing more information about the XJEase code being executed. […]
If your company makes use of internal part numbers in BOM files, from XJTAG version 3.3.9 onward we’ve added a simple way to have these automatically translated to their more commonly used manufacturer part numbers when matching devices to library files in XJDeveloper. […]
‘Dynamic Chains’ is a term we’ve coined to describe a test system that has the ability to drive more that 1 JTAG chain configuration. This may be possible if it has multiple chains driven by different TMS or TCK pins, or a single chain that has multiple JTAG device variations (for example using a Scan Bridge). Before v3.3, XJTAG projects [...]