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Stuck-at testing on 1149.6 pins

One of the standard types of testing that is done in XJTAG’s Connection Test is to detect stuck-high and stuck-low faults (shorts to power/ground). Using the IEEE 1149.1 JTAG standard this can be done providing the net has full IN/OUT functionality – that is to say it can both drive output and read input at the same time.  The test is implemented by driving the net high or low and then checking that the value read from the net changes to reflect the value driven. […]

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Dealing with the Covid-19 situation

We wish all of our customers the best at this difficult time, as everyone tries to keep their production and development moving, amidst supply line issues and staff being temporarily unavailable due to illness or the need to isolate themselves. XJTAG is of course affected by the current situation too, but we would like to reassure our customers that if you are able to work, we are able to support you. […]

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XJTAG version 3.10

A new major version of XJTAG – version 3.10 – is now available from our website for users who are in maintenance. […]

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Windows 7 Support

Microsoft is ending mainstream support for Windows 7 on January 14th, 2020. This means that after this date updates to fix security issues will not generally be available and so machines running Windows 7 will be more vulnerable to security risks and viruses. We understand that many users will choose to continue using Windows 7 after this date, with some organisations opting to purchase extended support. We will therefore ensure that XJTAG continues to work on Windows 7 for the time being. However, due to Windows 7 not being in mainstream support, our products will not receive the same level of testing as they do for Windows 10 and we would encourage our users to upgrade to Windows 10 when possible. […]

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A new WRITEABLE function in XJEase

For many years, the XJEase language has had the READABLE and WRITEABLE built-in functions. Their purpose is to try to work out whether it’s possible to read or write a pin before trying to do so. […]

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Using IIC to enable power supplies on your board

With the introduction of External Hardware per Subchain in XJDeveloper v3.9 it is possible to write a test that powers up your board using your XJLink2 to directly control the IIC pins before the JTAG chain is operable. Following is an example of how to set up this test in your project: […]

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External Hardware available per-Subchain (including testing without JTAG)

Version 3.9 of XJDeveloper introduces the ability to control which External Hardware machines operate in each Subchain, and integrates this control into the Dynamic Chains feature. This means that any test may now be configured to use just JTAG, just External Hardware, or a combination of both, to drive signals on the circuit under test. […]

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Editing configuration variables in XJTAG 3.9

Configuration variables in XJTAG allow settings to be configured for a device.  For example the address of an IIC device may need to be defined. Configuration variables are associated with a test device file, and in previous versions of XJTAG were only available in device files from the XJEase library. From XJTAG 3.9 configuration variables can be defined and edited in XJDeveloper. […]

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Migrating from XJRunnerIntegration.dll to XJIntegration.dll

Much of the content in the XJRunner .NET Integration is also relevant to the XJAnalyser .NET Integration, which is new for XJTAG 3.9. Therefore we have taken the decision to combine the two into a single new assembly, XJIntegration, which means that resources can be shared between the two integrations, and allows them both to be used in the same application if required. […]

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Functional test coverage in XJTAG version 3.8

In version 3.8 of XJTAG the way that functional test coverage is inferred has changed slightly. Here is a summary of what has changed. […]

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