Stuck-at testing on 1149.6 pins
One of the standard types of testing that is done in XJTAG’s Connection Test is to detect stuck-high and stuck-low faults (shorts to power/ground). Using the IEEE 1149.1 JTAG standard this can be done providing the net has full IN/OUT functionality – that is to say it can both drive output and read input at the same time. The test is implemented by driving the net high or low and then checking that the value read from the net changes to reflect the value driven. […]