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/ Tag:XJDeveloper

Functional test coverage in XJTAG version 3.8

In version 3.8 of XJTAG the way that functional test coverage is inferred has changed slightly. Here is a summary of what has changed. […]

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XJEase Waveform Viewer in XJDeveloper

From XJTAG version 3.8, the XJEase debugger in XJDeveloper now comes with a Waveform View providing more information about the XJEase code being executed. The XJEase Waveform View is designed to show you what your tests actually did in a style similar to that of a logic analyser, however instead of the bottom axis representing time, it shows the number of scans since the start of the capture. […]

New Layout Viewer

XJTAG 3.8 includes a new Layout Viewer. With similar functionality to the previous layout viewer, the new viewer contains a number of improvements. […]

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Test Summary Report

In XJTAG 3.7, XJDeveloper can now generate a new style of DFT report. The Test Summary Report can be found via the DFT Reports menu item within the Tools menu, or in the Reports menu on the DFT Analysis screen (as are the other DFT reports) and contains up to four sections: […]

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Automatic test list generation

From XJTAG 3.6 there is now a range of new options for generating the XJRunner test list automatically, to speed up project set-up time. […]

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New options for BOM importing

From XJDeveloper 3.6 a new BOM data type is available in the BOM Import dialog, the “Unfitted” device field. Any devices with an entry in a column assigned to this are suggested under the “Suggested Unfitted Devices” category on the Categorise Devices screen. […]

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Categorisation Suggestion Improvements

From XJTAG 3.6 onwards the suggested device categories on the Categorise Devices Screen have been renamed and expanded, with separate categories for different types of resistor packs. In addition, the “Suggested Resistors – Other” category now displays the reason for any resistor’s inclusion using a separate “Reason” column, to make the inclusion of a device into this category easier to understand. […]

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Custom cells in BSDL files

The JTAG standard contains definitions for various different types boundary scan cells, each of which have different capabilities, and these allow an IC vendor to accurately describe how the pins on their chips behave. But because not every eventuality can be foreseen the JTAG specification also allows IC vendors to create their own types of boundary scan cells.   […]

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Categorising devices: Ignore, Unfitted, or Uncategorised?

One of the questions we are commonly asked by new users, but also by users who have not used XJTAG for a while and are coming back to it, is about the differences between device categorisations in XJDeveloper. […]

Input parameters for test functions

Until now, XJRunner tests have been limited to functions which have no input arguments and a single return argument (which returns the result). XJTAG v3.5 relaxes that restriction, allowing input in XJRunner tests, though there is still a requirement to have a single return argument for the result. […]