Request a Demo

Improve your board test and debug process, XJTAG can speed up your design and development as well as providing excellent test coverage in production.
Request a demonstration of the XJTAG suite of test tools today

FREE board setup

FREE board setup
/ Tag:XJDeveloper

Using IIC to enable power supplies on your board

With the introduction of External Hardware per Subchain in XJDeveloper v3.9 it is possible to write a test that powers up your board using your XJLink2 to directly control the IIC pins before the JTAG chain is operable. Following is an example of how to set up this test in your project: […]

By |Categories: Features, Other, Support, XJDeveloper, XJEase|Tags: , , , , |

External Hardware available per-Subchain (including testing without JTAG)

Version 3.9 of XJDeveloper introduces the ability to control which External Hardware machines operate in each Subchain, and integrates this control into the Dynamic Chains feature. This means that any test may now be configured to use just JTAG, just External Hardware, or a combination of both, to drive signals on the circuit under test. […]

By |Categories: Features, Other, Support, XJDeveloper|Tags: , , |

Editing configuration variables in XJTAG 3.9

Configuration variables in XJTAG allow settings to be configured for a device.  For example the address of an IIC device may need to be defined. Configuration variables are associated with a test device file, and in previous versions of XJTAG were only available in device files from the XJEase library. From XJTAG 3.9 configuration variables can be defined and edited in XJDeveloper. […]

By |Categories: Support, XJDeveloper, XJEase|Tags: , , , |

XJTAG version 3.9

A new major version of XJTAG – version 3.9 – is now available from our website for users who are in maintenance. […]

XJEase Waveform Viewer updated in version 3.8.3

Version 3.8.3 of XJTAG comes with some usability updates for the new XJEase Waveform Viewer. Tool tip information, event labels, and a context menu for pin navigation and source tracking has been added. […]

Functional test coverage in XJTAG version 3.8

In version 3.8 of XJTAG the way that functional test coverage is inferred has changed slightly. Here is a summary of what has changed. […]

By |Categories: Support, XJDeveloper|Tags: , , , |

XJEase Waveform Viewer in XJDeveloper

From XJTAG version 3.8, the XJEase debugger in XJDeveloper now comes with a Waveform View providing more information about the XJEase code being executed. The XJEase Waveform View is designed to show you what your tests actually did in a style similar to that of a logic analyser, however instead of the bottom axis representing time, it shows the number of scans since the start of the capture. […]

New Layout Viewer

XJTAG 3.8 includes a new Layout Viewer. With similar functionality to the previous layout viewer, the new viewer contains a number of improvements. […]

By |Categories: Features, XJDeveloper, XJRunner|Tags: , , |

Test Summary Report

In XJTAG 3.7, XJDeveloper can now generate a new style of DFT report. The Test Summary Report can be found via the DFT Reports menu item within the Tools menu, or in the Reports menu on the DFT Analysis screen (as are the other DFT reports) and contains up to four sections: […]

By |Categories: Features, XJDeveloper|Tags: , , , , |

Automatic test list generation

From XJTAG 3.6 there is now a range of new options for generating the XJRunner test list automatically, to speed up project set-up time. […]

By |Categories: Features, XJDeveloper|Tags: , , |