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Functional test coverage in XJTAG version 3.8

In version 3.8 of XJTAG the way that functional test coverage is inferred has changed slightly. Here is a summary of what has changed. […]

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Test Coverage In XJDeveloper 3.8

With the release of XJDeveloper 3.8 the former DFT Analysis screen has been renamed to Test Coverage and merged with the Functional Test screen. The Functional Tests page is now accessed through the new Functional Tests tab at the top of the screen. The chart view has also moved to a separate tab, but all tabs can be rearranged and docked to suit the users preference. Other noticeable changes include the addition of a net access column to the Summary Statistics page and the reorganisation of the options section, along with the addition of a few new features. […]

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XJEase Waveform Viewer in XJDeveloper

From XJTAG version 3.8, the XJEase debugger in XJDeveloper now comes with a Waveform View providing more information about the XJEase code being executed. The XJEase Waveform View is designed to show you what your tests actually did in a style similar to that of a logic analyser, however instead of the bottom axis representing time, it shows the number of scans since the start of the capture. […]

New Layout Viewer

XJTAG 3.8 includes a new Layout Viewer. With similar functionality to the previous layout viewer, the new viewer contains a number of improvements. […]

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Test Summary Report

In XJTAG 3.7, XJDeveloper can now generate a new style of DFT report. The Test Summary Report can be found via the DFT Reports menu item within the Tools menu, or in the Reports menu on the DFT Analysis screen (as are the other DFT reports) and contains up to four sections: […]

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Setting the Rules for Suggesting Unfitted Devices

With XJDeveloper 3.7 the user now has more control over how unfitted devices are suggested. The Unfitted Rules Dialog allows for the specific suggestion methods to be enabled or disabled, allowing for more accurate unfitted device suggestions. […]

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Custom BOM fields

Previously, when importing BOM information users were limited to making assignments from a selection of pre-defined BOM fields. With XJDeveloper 3.7 users can now define custom BOM fields. […]

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More options for importing BOM information

The Bill of Materials, or BOM provides valuable information about the components in a netlist. This information is often key for project setups and, when available, is used by XJDeveloper to make project setup suggestions. This information is often taken from a separate BOM file or straight from a board’s netlist. With XJDeveloper 3.7 the volume of BOM data extracted for many of the netlist formats has increased. […]

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Automatic test list generation

From XJTAG 3.6 there is now a range of new options for generating the XJRunner test list automatically, to speed up project set-up time. […]

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New options for BOM importing

From XJDeveloper 3.6 a new BOM data type is available in the BOM Import dialog, the “Unfitted” device field. Any devices with an entry in a column assigned to this are suggested under the “Suggested Unfitted Devices” category on the Categorise Devices screen. […]

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