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PCOLA/SOQ Test Coverage in XJTAG. Part 1.

PCOLA/SOQ is a unified way to assess the test coverage offered by testing systems. Rather than directly considering what the test system can detect, it starts by considering everything that could be at fault in the device under test, and then scores how well the test system could identify such faults. […]

By |Categories: Features, Releases, XJDeveloper|Tags: , , |

Using IIC to enable power supplies on your board

With the introduction of External Hardware per Subchain in XJDeveloper v3.9 it is possible to write a test that powers up your board using your XJLink2 to directly control the IIC pins before the JTAG chain is operable. Following is an example of how to set up this test in your project: […]

By |Categories: Features, Other, Support, XJDeveloper, XJEase|Tags: , , , , |

External Hardware available per-Subchain (including testing without JTAG)

Version 3.9 of XJDeveloper introduces the ability to control which External Hardware machines operate in each Subchain, and integrates this control into the Dynamic Chains feature. This means that any test may now be configured to use just JTAG, just External Hardware, or a combination of both, to drive signals on the circuit under test. […]

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Editing configuration variables in XJTAG 3.9

Configuration variables in XJTAG allow settings to be configured for a device.  For example the address of an IIC device may need to be defined. Configuration variables are associated with a test device file, and in previous versions of XJTAG were only available in device files from the XJEase library. From XJTAG 3.9 configuration variables can be defined and edited in XJDeveloper. […]

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XJTAG version 3.9

A new major version of XJTAG – version 3.9 – is now available from our website for users who are in maintenance. […]

XJEase Waveform Viewer updated in version 3.8.3

Version 3.8.3 of XJTAG comes with some usability updates for the new XJEase Waveform Viewer. Tool tip information, event labels, and a context menu for pin navigation and source tracking has been added. […]

Functional test coverage in XJTAG version 3.8

In version 3.8 of XJTAG the way that functional test coverage is inferred has changed slightly. Here is a summary of what has changed. […]

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Test Coverage In XJDeveloper 3.8

With the release of XJDeveloper 3.8 the former DFT Analysis screen has been renamed to Test Coverage and merged with the Functional Test screen. The Functional Tests page is now accessed through the new Functional Tests tab at the top of the screen. The chart view has also moved to a separate tab, but all tabs can be rearranged and docked to suit the users preference. Other noticeable changes include the addition of a net access column to the Summary Statistics page and the reorganisation of the options section, along with the addition of a few new features. […]

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XJEase Waveform Viewer in XJDeveloper

From XJTAG version 3.8, the XJEase debugger in XJDeveloper now comes with a Waveform View providing more information about the XJEase code being executed. The XJEase Waveform View is designed to show you what your tests actually did in a style similar to that of a logic analyser, however instead of the bottom axis representing time, it shows the number of scans since the start of the capture. […]

New Layout Viewer

XJTAG 3.8 includes a new Layout Viewer. With similar functionality to the previous layout viewer, the new viewer contains a number of improvements. […]

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