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/ Features

PCOLA/SOQ Test Coverage in XJTAG. Part 1.

PCOLA/SOQ is a unified way to assess the test coverage offered by testing systems. Rather than directly considering what the test system can detect, it starts by considering everything that could be at fault in the device under test, and then scores how well the test system could identify such faults. […]

By |Categories: Features, Releases, XJDeveloper|Tags: , , |

Using IIC to enable power supplies on your board

With the introduction of External Hardware per Subchain in XJDeveloper v3.9 it is possible to write a test that powers up your board using your XJLink2 to directly control the IIC pins before the JTAG chain is operable. Following is an example of how to set up this test in your project: […]

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External Hardware available per-Subchain (including testing without JTAG)

Version 3.9 of XJDeveloper introduces the ability to control which External Hardware machines operate in each Subchain, and integrates this control into the Dynamic Chains feature. This means that any test may now be configured to use just JTAG, just External Hardware, or a combination of both, to drive signals on the circuit under test. […]

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XJAnalyser .NET Integration

In XJTAG 3.9 the previous .NET-based integration has been replaced with a new XJIntegration API. The new API still uses .NET 4.7.1 and contains all the XJRunner Integration functionality of previous releases – but also¬†introduces XJAnalyser Integration, a new .NET API for XJAnalyser. […]

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XJEase Waveform Viewer updated in version 3.8.3

Version 3.8.3 of XJTAG comes with some usability updates for the new XJEase Waveform Viewer. Tool tip information, event labels, and a context menu for pin navigation and source tracking has been added. […]

Test Coverage In XJDeveloper 3.8

With the release of XJDeveloper 3.8 the former DFT Analysis screen has been renamed to Test Coverage and merged with the Functional Test screen. The Functional Tests page is now accessed through the new Functional Tests tab at the top of the screen. The chart view has also moved to a separate tab, but all tabs can be rearranged and docked to suit the users preference. Other noticeable changes include the addition of a net access column to the Summary Statistics page and the reorganisation of the options section, along with the addition of a few new features. […]

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XJEase Waveform Viewer in XJDeveloper

From XJTAG version 3.8, the XJEase debugger in XJDeveloper now comes with a Waveform View providing more information about the XJEase code being executed. The XJEase Waveform View is designed to show you what your tests actually did in a style similar to that of a logic analyser, however instead of the bottom axis representing time, it shows the number of scans since the start of the capture. […]

New Layout Viewer

XJTAG 3.8 includes a new Layout Viewer. With similar functionality to the previous layout viewer, the new viewer contains a number of improvements. […]

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Test Summary Report

In XJTAG 3.7, XJDeveloper can now generate a new style of DFT report. The Test Summary Report can be found via the DFT Reports menu item within the Tools menu, or in the Reports menu on the DFT Analysis screen (as are the other DFT reports) and contains up to four sections: […]

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Automatic test list generation

From XJTAG 3.6 there is now a range of new options for generating the XJRunner test list automatically, to speed up project set-up time. […]

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