Extending XJTAG’s Signal Integrity Error Analysis

Continuing from XJTAG 3.12’s Enhanced Signal Integrity Analysis feature (see here and here), XJTAG 3.13 brings more algorithms to help identify potential issues with the JTAG chain. This article describes more of the symptoms it can spot and their likely causes. […]

Expanding Enhanced Signal Integrity Error Analysis

XJTAG 3.12 expanded the capability of the Signal Integrity Analysis in XJTAG tools, adding the ability to suggest certain causes of error. This post continues from the previous post on this subject, and describes further errors that XJTAG tries to identify. […]

Expanded Profile selection in XJDeveloper and XJAnalyser

With XJTAG 3.11 we’ve made some improvements for working with projects that use the Dynamic Chains feature. Previously, the Analyser, Debug Connection Test, and the Chain Debugger feature would always use the default profile for your project. Using a different profile for these features would require you to manually change the default profile in XJDeveloper. [...]

2023-11-14T20:51:55+00:00By |Categories: Features, Releases, XJDeveloper|Tags: , , |
Improve your printed circuit board test, debug and programming processes using XJTAG’s powerful boundary scan test suite. It can speed up your design and development, as well as providing excellent test coverage in production.
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