(This updates an older article due to the addition of the Excluded category in XJTAG 3.12) One of the questions we are commonly asked by new users, and also by users who have not used XJTAG for a while and are coming back to it, is about the differences between device categorisations in XJDeveloper. […]
One of the standard types of testing that is done in XJTAG’s Connection Test is to detect stuck-high and stuck-low faults (shorts to power/ground). Using the IEEE 1149.1 JTAG standard this can be done providing the net has full IN/OUT functionality – that is to say it can both drive output and read input at the same time. The test is implemented by driving the net high or low and then checking that the value read from the net changes to reflect the value driven. […]
(This article has now been replaced by an updated version, here.) […]
From XJTAG version 3.5, users are now able to view all the test data from the automated Connection Test by clicking on a link at the end of the Connection Test results within XJDeveloper, XJRunner, or formatted log files in the XJTAG Log File Viewer. The full output viewer shows the test data for one run of Connection Test at a time, and there is a dropdown box to change between the available test modes. […]
This post is an update to the original “Debugging Connection Test (part 1)” post – over time several features in XJTAG have changed considerably and may be hard to find by following my original post. […]
This post is to clarify how to specify terminations to a reference voltage in XJTAG. There are two special classes of passive device in XJTAG which represent termination resistors. […]
1149.6 testing is coming of age, and though XJTAG has supported IEEE Std. 1149.6 since software version 2.1 (released in 2008) it seems to us that 1149.6 devices are becoming much more common in the last couple of years. […]
When helping our customers to understand errors that Connection Test has discovered, we sometimes realise that XJTAG has the information the customer needs, if we were only to display a little more output. […]
This post is to try to clarify what XJTAG understands by the term “differential termination”. […]
This is a common question during the development of a test system. The problem generally occurs when a board is first run, and stems from a slight misunderstanding of what Checkchain is designed to do. This article therefore attempts to explain the difference between the Checkchain function and all other tests, in order to explain how this situation can happen. […]