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/ Bob Storey

About Bob Storey

Bob Storey is a developer at XJTAG. His role includes the continuing development of the automatic Connection Test and also the code which handles logic devices in XJTAG.

A new WRITEABLE function in XJEase

For many years, the XJEase language has had the READABLE and WRITEABLE built-in functions. Their purpose is to try to work out whether it’s possible to read or write a pin before trying to do so. […]

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XJTAG version 3.9

A new major version of XJTAG – version 3.9 – is now available from our website for users who are in maintenance. […]

Functional test coverage in XJTAG version 3.8

In version 3.8 of XJTAG the way that functional test coverage is inferred has changed slightly. Here is a summary of what has changed. […]

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XJTAG version 3.8

A new major version of XJTAG – version 3.8 – is now available from our website for users who are in maintenance. […]

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Test Summary Report

In XJTAG 3.7, XJDeveloper can now generate a new style of DFT report. The Test Summary Report can be found via the DFT Reports menu item within the Tools menu, or in the Reports menu on the DFT Analysis screen (as are the other DFT reports) and contains up to four sections: […]

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Fix for crashes with Windows 10 April 2018 Update (version 1803)

It has come to our attention that the April 2018 feature update to Windows 10 causes XJTAG software to crash. This entry details the problem and what to do about it. […]

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XJTAG version 3.7

A new major version of XJTAG – version 3.7 – is now available from our website for users who are in maintenance. […]

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An easier way to run SVF or STAPL files in XJTAG projects

There are new global functions in XJTAG 3.6 which are always available to use (like the built-in Connection Test). The functions RUNSTAPL and RUNSVF allow users to run programming files without having to write any further XJEase to enable this. […]

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XJTAG version 3.6

A new major version of XJTAG – version 3.6 – is now available from our website for users who are in maintenance. […]

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Custom cells in BSDL files

The JTAG standard contains definitions for various different types boundary scan cells, each of which have different capabilities, and these allow an IC vendor to accurately describe how the pins on their chips behave. But because not every eventuality can be foreseen the JTAG specification also allows IC vendors to create their own types of boundary scan cells.   […]

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