Revisions – part 3
This blog article is the final part of the three part series detailing the new Revisions feature in XJDeveloper 3.10. This article looks under the hood at how the device matching algorithm works. […]
Revisions – part 1
The big new feature in XJTAG 3.10 is Revisions support. We will be posting a 3 part blog series to go in to detail on how it works and how it can help you save time in your board setups. […]
XJTAG Extension for Altium Designer
XJTAG’s extension for Altium Designer is now available! It is called the XJTAG DFT Assistant and is aimed at board designers who want to improve the testability of their designs through boundary scan. […]
Wiring a bed of nails test jig for JTAG
When using JTAG with a Device Under Test (DUT) connected to a bed-of-nails test fixture, often little attention is paid to the way the JTAG signals are wired. This article (published in SMT magazine last year) gives a helpful explanation of why it is important to get this right, and gives tips for best practice.
XJTAG Boundary Scan Testing with OMAP 35xx devices
Texas Instruments’ OMAP processors are becoming more and more popular. We have seen quite a few come through the office recently. The good news is that the OMAP processors do support boundary scan testing. […]
TCK Termination
We all pay close attention to the termination of high speed signals, especially clock signals. However in many of the designs I see this doesn’t seem to have happened for the JTAG clock signal TCK. But TCK is a clock signal just like any other clock signal. […]
Voltage Measurements with XJLink2
One of the exciting new features of XJLink2 is the ability to measure a number of voltages. Via the 20-way XJlink2 connector you can measure up to 18 different voltages. This means supply rail voltages can be measured before (and during) JTAG testing, and analogue measurements are now simple to make during your tests. [...]
XJLink2 Frequency Measurement
XJLink2 is the only JTAG interface that can accurately measure frequency. […]
Integrating XJTAG with other Test Systems – DFT
This series of posts will cover how you can integrate XJTAG into your overall test system. This post is a quick reminder that you can use XJTAG as the focal point for your DFT analysis across all your test systems. […]
Pull Resistors
Many of us have been designing electronics for years and haven’t really considered pull up and down resistor values. We just use the same old values like 10K. With some new silicon the leakage currents are higher than we have been used too. This means the pull resistors might not being doing the task we [...]