A new WRITEABLE function in XJEase
For many years, the XJEase language has had the READABLE and WRITEABLE built-in functions. Their purpose is to try to work out whether it’s possible to read or write a pin before trying to do so. […]
Using IIC to enable power supplies on your board
With the introduction of External Hardware per Subchain in XJDeveloper v3.9 it is possible to write a test that powers up your board using your XJLink2 to directly control the IIC pins before the JTAG chain is operable. Following is an example of how to set up this test in your project: […]
External Hardware available per-Subchain (including testing without JTAG)
Version 3.9 of XJDeveloper introduces the ability to control which External Hardware machines operate in each Subchain, and integrates this control into the Dynamic Chains feature. This means that any test may now be configured to use just JTAG, just External Hardware, or a combination of both, to drive signals on the circuit under test. […]
Editing configuration variables in XJTAG 3.9
Configuration variables in XJTAG allow settings to be configured for a device. For example the address of an IIC device may need to be defined. Configuration variables are associated with a test device file, and in previous versions of XJTAG were only available in device files from the XJEase library. From XJTAG 3.9 configuration variables can be defined and edited in XJDeveloper. […]
Migrating from XJRunnerIntegration.dll to XJIntegration.dll
Much of the content in the XJRunner .NET Integration is also relevant to the XJAnalyser .NET Integration, which is new for XJTAG 3.9. Therefore we have taken the decision to combine the two into a single new assembly, XJIntegration, which means that resources can be shared between the two integrations, and allows them both to be used in the same application if required. […]
Functional test coverage in XJTAG version 3.8
In version 3.8 of XJTAG the way that functional test coverage is inferred has changed slightly. Here is a summary of what has changed. […]
Setting the Rules for Suggesting Unfitted Devices
With XJDeveloper 3.7 the user now has more control over how unfitted devices are suggested. The Unfitted Rules Dialog allows for the specific suggestion methods to be enabled or disabled, allowing for more accurate unfitted device suggestions. […]
New options for BOM importing
From XJDeveloper 3.6 a new BOM data type is available in the BOM Import dialog, the “Unfitted” device field. Any devices with an entry in a column assigned to this are suggested under the “Suggested Unfitted Devices” category on the Categorise Devices screen. […]
Categorisation Suggestion Improvements
From XJTAG 3.6 onwards the suggested device categories on the Categorise Devices Screen have been renamed and expanded, with separate categories for different types of resistor packs. In addition, the “Suggested Resistors – Other” category now displays the reason for any resistor’s inclusion using a separate “Reason” column, to make the inclusion of a device into this category easier to understand. […]
Custom cells in BSDL files
The JTAG standard contains definitions for various different types boundary scan cells, each of which have different capabilities, and these allow an IC vendor to accurately describe how the pins on their chips behave. But because not every eventuality can be foreseen the JTAG specification also allows IC vendors to create their own types of boundary scan cells. […]