Configuration variables in XJTAG allow settings to be configured for a device. For example the address of an IIC device may need to be defined. Configuration variables are associated with a test device file, and in previous versions of XJTAG were only available in device files from the XJEase library. From XJTAG 3.9 configuration variables can be defined and edited in XJDeveloper. […]
Much of the content in the XJRunner .NET Integration is also relevant to the XJAnalyser .NET Integration, which is new for XJTAG 3.9. Therefore we have taken the decision to combine the two into a single new assembly, XJIntegration, which means that resources can be shared between the two integrations, and allows them both to be used in the same application if required. […]
In version 3.8 of XJTAG the way that functional test coverage is inferred has changed slightly. Here is a summary of what has changed. […]
With XJDeveloper 3.7 the user now has more control over how unfitted devices are suggested. The Unfitted Rules Dialog allows for the specific suggestion methods to be enabled or disabled, allowing for more accurate unfitted device suggestions. […]
From XJDeveloper 3.6 a new BOM data type is available in the BOM Import dialog, the “Unfitted” device field. Any devices with an entry in a column assigned to this are suggested under the “Suggested Unfitted Devices” category on the Categorise Devices screen. […]
From XJTAG 3.6 onwards the suggested device categories on the Categorise Devices Screen have been renamed and expanded, with separate categories for different types of resistor packs. In addition, the “Suggested Resistors – Other” category now displays the reason for any resistor’s inclusion using a separate “Reason” column, to make the inclusion of a device into this category easier to understand. […]
The JTAG standard contains definitions for various different types boundary scan cells, each of which have different capabilities, and these allow an IC vendor to accurately describe how the pins on their chips behave. But because not every eventuality can be foreseen the JTAG specification also allows IC vendors to create their own types of boundary scan cells. […]
(This article has now been replaced by an updated version, here.) […]
We understand that sometimes (for your own sanity if nothing else) you need to test that your test equipment is working. For this reason, it is possible to run a health-check on XJLink2 hardware (and XJLink2-based hardware) using the self-test feature available in the XJLink Manager. The self test can be run with or without a loopback connector but should never be run with the XJLink connected to test hardware. […]
Alongside other improvements to the XJRunner test setup, XJTAG v3.5 has a new interface to specify bus access from the test system using the XJRunner Setup screen. When you edit a test there is now a Bus Access tab on the dialog, which allows full control of which pins are used to read and/or write from a bus during the test. […]