In XJTAG 3.7, XJDeveloper can now generate a new style of DFT report. The Test Summary Report can be found via the DFT Reports menu item within the Tools menu, or in the Reports menu on the DFT Analysis screen (as are the other DFT reports) and contains up to four sections:
- Test Coverage: This section shows summary statistics for the boards in the project. There are up to three graphs generated for each board, as well as a set of graphs for all boards combined. These graphs can currently be found in the Analysis by Circuit Element report and include a summary graph, a graph showing the test coverage by type, and a graph showing the coverage provided by functional test groups.
- Available Tests: This section contains a table which lists all tests currently in the XJRunner Test List and, where possible, shows a description of what the test does and what device(s) it is testing. This extra information is extracted from the XJEase Docs on the test function – any triple-slash comment lines that appear directly before a function and before the first XJEase Doc tag is taken as the description of what the test does, while the new @devices tag is used to specify the devices that are being tested (intended for circuit test functions – device file test functions are already linked to their associated device).
- Compliance pins: This section lists compliance pins that have been specified in the project, and whether they appear to be set correctly or not.
- Project notes: This section shows the project notes connected to the project.
The first page of the Test Summary Report wizard allows you to choose which sections will be included in the report. If including the Test Coverage section, you can further choose which graphs are included, as well as which boards in the project are used to generate the graphs.
The Test Summary Report can be exported to a PDF file so that it can be saved or sent to anyone who needs to see the circuit coverage statistics in a readable form.
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