This post introduces the new DFT reports which are generated from the DFT analysis data. This is a feature introduced in XJTAG version 2.4.

The DFT reports are designed to be either printed or the data exported for use in another application.

Types of reports you can generate

  • Analysis by Circuit Element
    This report contains statistics for elements in the circuit. These can either be the entire circuit or for groups of elements such as boards, devices or nets. It can also provide detailed test coverage for each pin.
  • Analysis by Coverage Type
    This report produces board level lists of individual pins according to whether or not they are covered for specific types of test coverage.
  • Test Point Reduction
    Having test points on nets where good test coverage can be achieved with XJTAG is not necessary and uses up board space. This report lists these nets and suggests elimination of the test points where appropriate.
  • Test Point Suggestion
    It is possible that test coverage on some nets could be improved by adding a test point. This report suggests nets where the designer might consider adding them.

Generating DFT Reports

DFT reports can be generated without having to go to the DFT screen: the Reports wizard can be launched from the Reports button in the Tools menu from anywhere in XJDeveloper. If you are on the DFT screen you can also launch the Reports wizard by clicking the corresponding button at the bottom of the circuit elements list.

Note that the filter options set on the Reports wizard are independent from the ones on the DFT Analysis screen; any filter options used on the DFT Analysis screen to narrow down data have no effect on the generated reports.