Design for Test Analysis in XJDeveloper 2.4 – Part 2
This post introduces the new DFT reports which are generated from the DFT analysis data. This is a feature introduced in XJTAG version 2.4. […]
Design for Test Analysis in XJDeveloper 2.4 – Part 1
The DFT Analysis screen in XJTAG version 2.4 has been completely redesigned to allow you to assess the test coverage of your circuit design more easily and in a more efficient way. This post highlights the most important new features. […]
XJRunner Log File Viewer
In XJRunner, the Log File Viewer is a enhanced dialogue which allows you to view XJRunner’s logged output without having to open an external text file viewer. […]
Test Modes in XJRunner – part 2
This post highlights the new Independent mode of testing introduced in XJRunner from version 2.3. Group mode was covered in an earlier entry. […]
Test Modes in XJRunner – part 1
If you have multiple XJLinks plugged into your machine, the main testing screen of XJRunner enables you to test multiple boards simultaneously. From XJTAG version 2.3 we have increased the flexibility of this by introducing two different test modes. This post highlights Group mode. Independent mode will be covered in a future post. [...]