A new major version of XJTAG – version 3.3 – is now available from our website for users who are in maintenance.
Dynamic Chain configuration
Dynamic Chain features allow additional flexibility:
- where multiple chains in a circuit are driven by independent TMS and TCK pins.
- where a single chain has varying JTAG device combinations (eg when using Scan Bridge devices).
Using Dynamic chains also allows for more powerful reset requences that initialise the board in a particular order, and allows the user to select tests to run on a shorter chain, potentially improving test or programming speed.
Using spare XJLink2 pins in Connection Test
In XJTAG v3.3 it is optionally possible to define exactly how the XJLink2 is connected to the test hardware. When this connection is defined, spare I/O pins on the XJLink2 can be configured to take part in the connection test, further enhancing test coverage.
XJEase language performance enhancements
A new XJEase compiler provides a significant boost in the performance of XJEase testing in many applications.
As always, a large number of bug-fixes, feature requests and other minor enhancements have been included in this release. If you find bugs, have problems or think of further feature requests please do let us know by contacting XJTAG support.