XJTAG Blog2023-11-14T20:51:54+00:00
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Welcome to the XJTAG blog

We believe that sharing our knowledge will help you get the most out of your XJTAG system. This is where our development and support team share their insights and experience. You’ll find posts highlighting particular features of the different software packages that make up the XJTAG development system or aspects of the XJEase language.

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Introducing Dynamic Chains

‘Dynamic Chains’ is a term we’ve coined to describe a test system that has the ability to drive more that 1 JTAG chain configuration. This may be possible if it has multiple chains driven by different TMS or TCK pins, or a single chain that has multiple JTAG device variations (for example using a Scan Bridge). Before v3.3, XJTAG projects could only represent a single [...]

By |March 30th, 2015|Categories: Features, XJDeveloper, XJEase, XJRunner|Tags: , , , , |0 Comments

Wiring a bed of nails test jig for JTAG

When using JTAG with a Device Under Test (DUT) connected to a bed-of-nails test fixture, often little attention is paid to the way the JTAG signals are wired. This article (published in SMT magazine last year) gives a helpful explanation of why it is important to get this right, and gives tips for best practice.

By |March 25th, 2015|Categories: Board Design, Electronics Tips, Support|Tags: , |0 Comments
Improve your printed circuit board test, debug and programming processes using XJTAG’s powerful boundary scan test suite. It can speed up your design and development, as well as providing excellent test coverage in production.
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