XJTAG Blog2025-04-14T12:20:47+01:00

Welcome to the XJTAG support blog

This is your go-to space for tips, insights, and updates straight from the XJTAG development and support team. We’re here to help you get the most out of your XJTAG system by sharing our knowledge, experience, and best practices. You’ll find posts highlighting particular features of the different software packages that make up the XJTAG development system or aspects of the XJEase language.

Have a topic you’d like us to cover or a question you want answered? Let us know!

For product updates check out the Updates Hub.

Pull Resistors

Many of us have been designing electronics for years and haven’t really considered pull up and down resistor values. We just use the same old values like 10K. With some new silicon the leakage currents are higher than we have been used too. This means the pull resistors might not being doing the task we require. When there is a [...]

By |July 13th, 2009|Categories: Board Design|Tags: |0 Comments

Functional Tests

This post highlights the “Functional Tests” screen in XJDeveloper. The “Functional Tests” screen is in the “Design For Test” section in XJDeveloper. It is used to indicate to XJTAG that part of a board has been tested in some way outside of XJTAG. Doing this will make the DFT test coverage figures more accurate, and means you can use XJTAG [...]

By |July 6th, 2009|Categories: XJDeveloper|Tags: , |0 Comments

Have an idea for XJTAG?

Suggest topics you'd like to see covered by future posts, for example: if you would like a post to be extended to give more detail about boundary scan and electronics testing in general a specific feature of XJTAG software and how to make the most of it topics of general electronics interest proposed new features for the XJTAG tools Please [...]

By |June 1st, 2009|Categories: Support|1 Comment
Improve your printed circuit board test, debug and programming processes using XJTAG’s powerful boundary scan test suite. It can speed up your design and development, as well as providing excellent test coverage in production.
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