New board to protect against current spikes

One potential cause of damage to an XJLink2 JTAG controller is transient current spikes caused when a board is first powered on and the decoupling capacitors are charged. We’ve talked about this issue on the blog before and shown that, unfortunately, even a very brief spike in current can cause damage to the controller. Introducing [...]

XJPack files in JTAG Chain Debugger

XJTAG 4.0 introduced Optimised Scans, providing more options for configuring JTAG chains and improving scan speeds. To assist debugging any problems getting chains to run when deploying projects using these new features into a production environment, JTAG Chain debugger has also been given an update: if run in a system with an XJRunner licence, the [...]

2024-06-11T12:38:30+01:00By |Categories: JTAG Chain Debugger, Releases|Tags: , , |

Optimised Scans

Optimised scans is a new feature added to XJTAG 4.0 and it provides a number of improvements aimed at increasing test speed. With Optimised Scans enabled, every JTAG TAP will scan data through at a separate frequency based on the capabilities of the JTAG devices in that TAP group. […]

2024-06-03T16:49:49+01:00By |Categories: Features, XJDeveloper|Tags: , |
Improve your printed circuit board test, debug and programming processes using XJTAG’s powerful boundary scan test suite. It can speed up your design and development, as well as providing excellent test coverage in production.
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