Introducing Dynamic Chains

‘Dynamic Chains’ is a term we’ve coined to describe a test system that has the ability to drive more that 1 JTAG chain configuration. This may be possible if it has multiple chains driven by different TMS or TCK pins, or a single chain that has multiple JTAG device variations (for example using a Scan Bridge). Before v3.3, XJTAG projects [...]

The Safe bitstream

The Safe bitstream gets mentioned occasionally in our documentation and warning/error messages and this blog post attempts to shed some light on what it is and what it’s used for. […]

2023-11-14T20:52:03+00:00By |Categories: XJEase|Tags: |

Using XJEase functions in XJRunner tests

A frequent question from customers is, “Why is my new XJEase test function not listed when I create an XJRunner test?” XJEase Functions For a function to be eligible to be made available to XJRunner it must be in the main project (.xje) file or a device file, or in a code file specified either [...]

2017-04-21T14:43:35+01:00By |Categories: XJDeveloper, XJEase|
Improve your printed circuit board test, debug and programming processes using XJTAG’s powerful boundary scan test suite. It can speed up your design and development, as well as providing excellent test coverage in production.
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