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Introducing Dynamic Chains

‘Dynamic Chains’ is a term we’ve coined to describe a test system that has the ability to drive more that 1 JTAG chain configuration. This may be possible if it has multiple chains driven by different TMS or TCK pins, or a single chain that has multiple JTAG device variations (for example using a Scan Bridge). Before v3.3, XJTAG projects could only represent a single static JTAG chain. With our new functionality, multiple JTAG chain variations can be defined, set up and run within a single XJTAG project in a single test run. […]

Wiring a bed of nails test jig for JTAG

When using JTAG with a Device Under Test (DUT) connected to a bed-of-nails test fixture, often little attention is paid to the way the JTAG signals are wired. This article (published in SMT magazine last year) gives a helpful explanation of why it is important to get this right, and gives tips for best practice.

By |Categories: Board Design, Electronics Tips, Support|Tags: , |

Using XJTAG without netlists

XJTAG is a great system for board designers and manufacturers, but people looking to repair boards often do not have  netlists for those boards – something that until now has been essential to start an XJDeveloper project. […]

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Automatic suggestion of JTAG chains

To help get your tests up and running more quickly and easily, version 2.7 of XJDeveloper has a new feature which can make suggestions for the JTAG chains in your project. […]

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