From XJTAG 3.6 onwards the suggested device categories on the Categorise Devices Screen have been renamed and expanded, with separate categories for different types of resistor packs. In addition, the “Suggested Resistors – Other” category now displays the reason for any resistor’s inclusion using a separate “Reason” column, to make the inclusion of a device into this category easier to understand. […]
The JTAG standard contains definitions for various different types boundary scan cells, each of which have different capabilities, and these allow an IC vendor to accurately describe how the pins on their chips behave. But because not every eventuality can be foreseen the JTAG specification also allows IC vendors to create their own types of boundary scan cells. […]
(This article has now been replaced by an updated version, here.) […]
We understand that sometimes (for your own sanity if nothing else) you need to test that your test equipment is working. For this reason, it is possible to run a health-check on XJLink2 hardware (and XJLink2-based hardware) using the self-test feature available in the XJLink Manager. The self test can be run with or without a loopback connector but should never be run with the XJLink connected to test hardware. […]
Today (31 Mar 2016) we have released a major update to the XJTAG XJEase library. The new library will be installed if you update to version 3.4.5 of XJTAG which is also released today. […]
This post is an update to the original “Debugging Connection Test (part 1)” post – over time several features in XJTAG have changed considerably and may be hard to find by following my original post. […]
Recently one of our newer customers started on their first solo board setup. They had previously seen XJTAG demonstrated and had also had their initial board setup done by an XJTAG engineer. When they came to setting a board up for themselves they tried to follow the path that the XJTAG engineer had talked them through – […]
Transistors are one of the things we get asked about quite a bit: “How should I categorise the transistors in my project?” […]
Windows XP was released in October 2001 and has been one of Microsoft’s most successful operating systems. […]
‘Dynamic Chains’ is a term we’ve coined to describe a test system that has the ability to drive more that 1 JTAG chain configuration. This may be possible if it has multiple chains driven by different TMS or TCK pins, or a single chain that has multiple JTAG device variations (for example using a Scan Bridge). Before v3.3, XJTAG projects could only represent a single static JTAG chain. With our new functionality, multiple JTAG chain variations can be defined, set up and run within a single XJTAG project in a single test run. […]