Categorising devices: Ignore, Unfitted, or Uncategorised?
(This article has now been replaced by an updated version, here.) […]
Input parameters for test functions
Until now, XJRunner tests have been limited to functions which have no input arguments and a single return argument (which returns the result). XJTAG v3.5 relaxes that restriction, allowing input in XJRunner tests, though there is still a requirement to have a single return argument for the result. […]
Specifying bus access during XJRunner tests
Alongside other improvements to the XJRunner test setup, XJTAG v3.5 has a new interface to specify bus access from the test system using the XJRunner Setup screen. When you edit a test there is now a Bus Access tab on the dialog, which allows full control of which pins are used to read and/or write [...]
Conditional testing in XJRunner
It has always been possible to construct tests in XJEase which were conditional on something else having happened, or a previous test having passed, but the new v3.5 release includes a number of major enhancements to the setup, running and control of tests in XJDeveloper and XJRunner, some of which make conditional testing much easier to [...]
New XJEase library available
Today (31 Mar 2016) we have released a major update to the XJTAG XJEase library. The new library will be installed if you update to version 3.4.5 of XJTAG which is also released today. […]
Why categorise resistors, inductors, links and fuses?
Recently one of our newer customers started on their first solo board setup. They had previously seen XJTAG demonstrated and had also had their initial board setup done by an XJTAG engineer. When they came to setting a board up for themselves they tried to follow the path that the XJTAG engineer had talked them [...]
Better suggestions for power and ground net categorisation
We’ve made some improvements to the Power/Ground nets screen to make it easier to identify power and ground nets. We recommend that the first thing you do after adding your board is to classify the power and ground nets on the boards. This will improve our ability to correctly suggest categorisations for your devices, in [...]
Categorising Transistors in XJDeveloper
Transistors are one of the things we get asked about quite a bit: “How should I categorise the transistors in my project?” […]
Introducing Dynamic Chains
‘Dynamic Chains’ is a term we’ve coined to describe a test system that has the ability to drive more that 1 JTAG chain configuration. This may be possible if it has multiple chains driven by different TMS or TCK pins, or a single chain that has multiple JTAG device variations (for example using a Scan Bridge). Before v3.3, XJTAG projects [...]
Wiring a bed of nails test jig for JTAG
When using JTAG with a Device Under Test (DUT) connected to a bed-of-nails test fixture, often little attention is paid to the way the JTAG signals are wired. This article (published in SMT magazine last year) gives a helpful explanation of why it is important to get this right, and gives tips for best practice.