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/ Features

Errors and Warnings pane improvements

In version 3.4 of XJTAG we have aimed to improve the usefulness of the Errors and Warnings panes by adding a number of new ways to interact with errors and warnings. When you have errors or warnings in your project, it sometimes isn’t immediately obvious what the cause is or where they can be fixed. […]

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Formatted Log Files

It is now possible to produce log files which save the test output to be displayed at a later time in the same way as it is displayed on the Run Tests screen. When these formatted log files are viewed, they contain the tables, expandable sections and hyperlinks as are displayed in the test output on the Run Tests screen. […]

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Waveform View

One of the exciting new features in version 3.4 of XJTAG is a Waveform View that can display the JTAG chain data from XJAnalyser. The Waveform View can display the waveform traces from pins or buses in XJAnalyser in real time, providing useful debug information for your boards. […]

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Making the BSDL library more useful

If you use the BSDL library, a new option will now appear (from XJTAG version 3.3.7) when you categorise a JTAG device in XJDeveloper by selecting it from the library - it will offer to copy the BSDL file into another folder (defaulting to your local project directory). It is up to you whether to [...]

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Company Part Numbers

If your company makes use of internal part numbers in BOM files, from XJTAG version 3.3.9  onward we’ve added a simple way to have these automatically translated to their more commonly used manufacturer part numbers when matching devices to library files in XJDeveloper. […]

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Context menus in Layout Viewer

In version 3.3.7 of XJTAG we have added some new usability improvements to the Layout Viewer tool. You can now right-click on any net or component in Layout Viewer to get a list of options related to that specific object. […]

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Terminations to a reference voltage in XJTAG

This post is to clarify how to specify terminations to a reference voltage in XJTAG. There are two special classes of passive device in XJTAG which represent termination resistors. […]

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1149.6 testing in XJTAG

1149.6 testing is coming of age, and though XJTAG has supported IEEE Std. 1149.6 since software version 2.1 (released in 2008) it seems to us that 1149.6 devices are becoming much more common in the last couple of years. […]

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Layout Viewer Visualisation

Having lots of information is great, but sometimes the most difficult thing is displaying that data in a meaningful way. We have created two new information overlays for Layout Viewer, allowing you to visualise test coverage statistics or live pin data from Analyser on your board layout. […]

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Introducing Dynamic Chains

‘Dynamic Chains’ is a term we’ve coined to describe a test system that has the ability to drive more that 1 JTAG chain configuration. This may be possible if it has multiple chains driven by different TMS or TCK pins, or a single chain that has multiple JTAG device variations (for example using a Scan Bridge). Before v3.3, XJTAG projects could only represent a single static JTAG chain. With our new functionality, multiple JTAG chain variations can be defined, set up and run within a single XJTAG project in a single test run. […]