Revisions – part 2
This blog article is the second part of a three part series detailing the new Revisions feature in XJDeveloper 3.10. This article covers the setup process for a revisions project. […]
This blog article is the second part of a three part series detailing the new Revisions feature in XJDeveloper 3.10. This article covers the setup process for a revisions project. […]
The big new feature in XJTAG 3.10 is Revisions support. We will be posting a 3 part blog series to go in to detail on how it works and how it can help you save time in your board setups. […]
PCOLA/SOQ is a unified way to assess the test coverage offered by testing systems. Rather than directly considering what the test system can detect, it starts by considering everything that could be at fault in the device under test, and then scores how well the test system could identify such faults. […]
With the introduction of External Hardware per Subchain in XJDeveloper v3.9 it is possible to write a test that powers up your board using your XJLink2 to directly control the IIC pins before the JTAG chain is operable. Following is an example of how to set up this test in your project: [...]
Version 3.9 of XJDeveloper introduces the ability to control which External Hardware machines operate in each Subchain, and integrates this control into the Dynamic Chains feature. This means that any test may now be configured to use just JTAG, just External Hardware, or a combination of both, to drive signals on the circuit under test. [...]
Configuration variables in XJTAG allow settings to be configured for a device. For example the address of an IIC device may need to be defined. Configuration variables are associated with a test device file, and in previous versions of XJTAG were only available in device files from the XJEase library. From XJTAG 3.9 configuration variables [...]
A new major version of XJTAG – version 3.9 – is now available from our website for users who are in maintenance. […]
Version 3.8.3 of XJTAG comes with some usability updates for the new XJEase Waveform Viewer. Tool tip information, event labels, and a context menu for pin navigation and source tracking has been added. […]
In version 3.8 of XJTAG the way that functional test coverage is inferred has changed slightly. Here is a summary of what has changed. […]
With the release of XJDeveloper 3.8 the former DFT Analysis screen has been renamed to Test Coverage and merged with the Functional Test screen. The Functional Tests page is now accessed through the new Functional Tests tab at the top of the screen. The chart view has also moved to a separate tab, but all [...]