Custom BOM fields
Previously, when importing BOM information users were limited to making assignments from a selection of pre-defined BOM fields. With XJDeveloper 3.7 users can now define custom BOM fields. […]
Previously, when importing BOM information users were limited to making assignments from a selection of pre-defined BOM fields. With XJDeveloper 3.7 users can now define custom BOM fields. […]
The Bill of Materials, or BOM provides valuable information about the components in a netlist. This information is often key for project setups and, when available, is used by XJDeveloper to make project setup suggestions. This information is often taken from a separate BOM file or straight from a board’s netlist. With XJDeveloper 3.7 the [...]
From XJTAG 3.6 there is now a range of new options for generating the XJRunner test list automatically, to speed up project set-up time. […]
From XJDeveloper 3.6 a new BOM data type is available in the BOM Import dialog, the “Unfitted” device field. Any devices with an entry in a column assigned to this are suggested under the “Suggested Unfitted Devices” category on the Categorise Devices screen. […]
There are new global functions in XJTAG 3.6 which are always available to use (like the built-in Connection Test). The functions RUNSTAPL and RUNSVF allow users to run programming files without having to write any further XJEase to enable this. […]
From XJTAG 3.6 onwards the suggested device categories on the Categorise Devices Screen have been renamed and expanded, with separate categories for different types of resistor packs. In addition, the “Suggested Resistors – Other” category now displays the reason for any resistor’s inclusion using a separate “Reason” column, to make the inclusion of a device into this category easier to understand. [...]
From XJTAG version 3.6, the XJEase debugger in XJDeveloper now comes with a Call Stack window providing more information about the XJEase code being executed. […]
The JTAG standard contains definitions for various different types boundary scan cells, each of which have different capabilities, and these allow an IC vendor to accurately describe how the pins on their chips behave. But because not every eventuality can be foreseen the JTAG specification also allows IC vendors to create their own types of [...]
(This article has now been replaced by an updated version, here.) […]
Until now, XJRunner tests have been limited to functions which have no input arguments and a single return argument (which returns the result). XJTAG v3.5 relaxes that restriction, allowing input in XJRunner tests, though there is still a requirement to have a single return argument for the result. […]