Recently one of our newer customers started on their first solo board setup. They had previously seen XJTAG demonstrated and had also had their initial board setup done by an XJTAG engineer. When they came to setting a board up for themselves they tried to follow the path that the XJTAG engineer had talked them through – […]
In version 3.4 of XJTAG we have aimed to improve the usefulness of the Errors and Warnings panes by adding a number of new ways to interact with errors and warnings. When you have errors or warnings in your project, it sometimes isn’t immediately obvious what the cause is or where they can be fixed. […]
We’ve made some improvements to the Power/Ground nets screen to make it easier to identify power and ground nets. We recommend that the first thing you do after adding your board is to classify the power and ground nets on the boards. This will improve our ability to correctly suggest categorisations for your devices, in particular telling the difference between pull resistors and series resistors. […]
It is now possible to produce log files which save the test output to be displayed at a later time in the same way as it is displayed on the Run Tests screen. When these formatted log files are viewed, they contain the tables, expandable sections and hyperlinks as are displayed in the test output on the Run Tests screen. […]
One of the exciting new features in version 3.4 of XJTAG is a Waveform View that can display the JTAG chain data from XJAnalyser. The Waveform View can display the waveform traces from pins or buses in XJAnalyser in real time, providing useful debug information for your boards. […]
Transistors are one of the things we get asked about quite a bit: “How should I categorise the transistors in my project?” […]
In version 3.3.7 of XJTAG we have added some new usability improvements to the Layout Viewer tool. You can now right-click on any net or component in Layout Viewer to get a list of options related to that specific object. […]
Having lots of information is great, but sometimes the most difficult thing is displaying that data in a meaningful way. We have created two new information overlays for Layout Viewer, allowing you to visualise test coverage statistics or live pin data from Analyser on your board layout. […]
‘Dynamic Chains’ is a term we’ve coined to describe a test system that has the ability to drive more that 1 JTAG chain configuration. This may be possible if it has multiple chains driven by different TMS or TCK pins, or a single chain that has multiple JTAG device variations (for example using a Scan Bridge). Before v3.3, XJTAG projects could only represent a single static JTAG chain. With our new functionality, multiple JTAG chain variations can be defined, set up and run within a single XJTAG project in a single test run. […]
XJTAG is a great system for board designers and manufacturers, but people looking to repair boards often do not have netlists for those boards – something that until now has been essential to start an XJDeveloper project. […]