If your project uses an ODB++ netlist, then you can take advantage of the Layout Viewer in both XJDeveloper and XJRunner. Layout Viewer uses the layout information in the netlist to allow you to visualise the physical location of components, pins and nets on a board. This is especially useful for visualising errors from the connection test to guide you towards the most likely location of a fault on a board. […]
Version 2.6 of XJDeveloper has two exciting new features that make developing your projects easier – a library of definitions for devices and a “suggest categorisation” feature. […]
From version 2.4 XJDeveloper and XJRunner support logic devices. A library of definitions for common logic devices is shipped with XJDeveloper. This post details this feature. […]
This post outlines how to categorise a device as a logic device in XJDeveloper and explains some of the useful features. […]
This post introduces the new DFT reports which are generated from the DFT analysis data. This is a feature introduced in XJTAG version 2.4. […]
The DFT Analysis screen in XJTAG version 2.4 has been completely redesigned to allow you to assess the test coverage of your circuit design more easily and in a more efficient way. This post highlights the most important new features. […]
We asked one of the guys in-house who works with XJDeveloper most of the time to give some tips from his experience of setting up projects, and here is what he came up with: […]
Why use CONNECT not PULL for low-value pull resistors? When a resistor is specified as a pull resistor the XJTAG system will expect two things: […]
Part 1 of this series explained how to add or edit the categories for the selectors in XJDeveloper. This entry will focus on using BOM (Bill of Materials) information in the selectors, using the demonstration board that comes with the XJTAG development system as an example. […]
This series of posts will cover how you can integrate XJTAG into your overall test system. This post is a quick reminder that you can use XJTAG as the focal point for your DFT analysis across all your test systems. […]