Introducing Dynamic Chains

‘Dynamic Chains’ is a term we’ve coined to describe a test system that has the ability to drive more that 1 JTAG chain configuration. This may be possible if it has multiple chains driven by different TMS or TCK pins, or a single chain that has multiple JTAG device variations (for example using a Scan Bridge). Before v3.3, XJTAG projects [...]

Layout Viewer

If your project uses an ODB++ netlist, then you can take advantage of the Layout Viewer in both XJDeveloper and XJRunner. Layout Viewer uses the layout information in the netlist to allow you to visualise the physical location of components, pins and nets on a board. This is especially useful for visualising errors from the [...]

2023-11-14T20:52:03+00:00By |Categories: Features, XJDeveloper, XJRunner|Tags: |
Improve your printed circuit board test, debug and programming processes using XJTAG’s powerful boundary scan test suite. It can speed up your design and development, as well as providing excellent test coverage in production.
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