New Layout Viewer
XJTAG 3.8 includes a new Layout Viewer. With similar functionality to the previous layout viewer, the new viewer contains a number of improvements. […]
Test Summary Report
In XJTAG 3.7, XJDeveloper can now generate a new style of DFT report. The Test Summary Report can be found via the DFT Reports menu item within the Tools menu, or in the Reports menu on the DFT Analysis screen (as are the other DFT reports) and contains up to four sections: [...]
Automatic test list generation
From XJTAG 3.6 there is now a range of new options for generating the XJRunner test list automatically, to speed up project set-up time. […]
New options for BOM importing
From XJDeveloper 3.6 a new BOM data type is available in the BOM Import dialog, the “Unfitted” device field. Any devices with an entry in a column assigned to this are suggested under the “Suggested Unfitted Devices” category on the Categorise Devices screen. […]
Categorisation Suggestion Improvements
From XJTAG 3.6 onwards the suggested device categories on the Categorise Devices Screen have been renamed and expanded, with separate categories for different types of resistor packs. In addition, the “Suggested Resistors – Other” category now displays the reason for any resistor’s inclusion using a separate “Reason” column, to make the inclusion of a device into this category easier to understand. [...]
Custom cells in BSDL files
The JTAG standard contains definitions for various different types boundary scan cells, each of which have different capabilities, and these allow an IC vendor to accurately describe how the pins on their chips behave. But because not every eventuality can be foreseen the JTAG specification also allows IC vendors to create their own types of [...]
Categorising devices: Ignore, Unfitted, or Uncategorised?
(This article has now been replaced by an updated version, here.) […]
Input parameters for test functions
Until now, XJRunner tests have been limited to functions which have no input arguments and a single return argument (which returns the result). XJTAG v3.5 relaxes that restriction, allowing input in XJRunner tests, though there is still a requirement to have a single return argument for the result. […]
Specifying bus access during XJRunner tests
Alongside other improvements to the XJRunner test setup, XJTAG v3.5 has a new interface to specify bus access from the test system using the XJRunner Setup screen. When you edit a test there is now a Bus Access tab on the dialog, which allows full control of which pins are used to read and/or write [...]
Conditional testing in XJRunner
It has always been possible to construct tests in XJEase which were conditional on something else having happened, or a previous test having passed, but the new v3.5 release includes a number of major enhancements to the setup, running and control of tests in XJDeveloper and XJRunner, some of which make conditional testing much easier to [...]