Archive for the ‘DFT’ tag
Design for Test Analysis in XJDeveloper 2.4 – Part 2
22 November, 2010
This post introduces the new DFT reports which are generated from the DFT analysis data. This is a feature introduced in XJTAG version 2.4.
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By Tina Chremmou on 22 November, 2010 |
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Design for Test Analysis in XJDeveloper 2.4 – Part 1
25 October, 2010
The DFT Analysis screen in XJTAG version 2.4 has been completely redesigned to allow you to assess the test coverage of your circuit design more easily and in a more efficient way. This post highlights the most important new features. Read the rest of this entry »
By Tina Chremmou on 25 October, 2010 |
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Integrating XJTAG with other Test Systems – DFT
5 October, 2009
This series of posts will cover how you can integrate XJTAG into your overall test system.
This post is a quick reminder that you can use XJTAG as the focal point for your DFT analysis across all your test systems.
By John Barton on 5 October, 2009 |
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XJTAG Support Website
27 July, 2009
This post explores the wealth of information available on the XJTAG Support Webpage.
Knowledge Base
Answers to common questions we receive about XJTAG. Before contacting support it is a good idea to check here first to see if your question is answered. There will be future posts exploring some of these questions in more detail.
By John Barton on 27 July, 2009 |
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Functional Tests
6 July, 2009
This post highlights the “Functional Tests” screen in XJDeveloper.
The “Functional Tests” screen is in the “Design For Test” section in XJDeveloper. It is used to indicate to XJTAG that part of a board has been tested in some way outside of XJTAG. Doing this will make the DFT test coverage figures more accurate, and means you can use XJTAG as the focal point for all your DFT analysis across all your test systems.
By John Barton on 6 July, 2009 |
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