Introducing Dynamic Chains

‘Dynamic Chains’ is a term we’ve coined to describe a test system that has the ability to drive more that 1 JTAG chain configuration. This may be possible if it has multiple chains driven by different TMS or TCK pins, or a single chain that has multiple JTAG device variations (for example using a Scan Bridge). Before v3.3, XJTAG projects [...]

Fault Dictionary

One of the new features in the recent v3.1 software release is a Fault Dictionary. This release cycle, one of our main goals was to make XJTAG more production friendly, and the fault dictionary provides a way of sharing relevant knowledge about a board between development and production engineers. […]

2023-11-14T20:52:02+00:00By |Categories: XJInvestigator, XJRunner|Tags: , |

How can Checkchain pass but Connection test report “broken chain”?

This is a common question during the development of a test system. The problem generally occurs when a board is first run, and stems from a slight misunderstanding of what Checkchain is designed to do. This article therefore attempts to explain the difference between the Checkchain function and all other tests, in order to explain [...]

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