‘Dynamic Chains’ is a term we’ve coined to describe a test system that has the ability to drive more that 1 JTAG chain configuration. This may be possible if it has multiple chains driven by different TMS or TCK pins, or a single chain that has multiple JTAG device variations (for example using a Scan Bridge). Before v3.3, XJTAG projects [...]
In Version 3.0.2 and later an additional Settings tab has been added to the XJRunner Setup screen in XJDeveloper. This tab, labelled “Functions”, […]
A new XJRunner Integration .NET API was released in XJTAG 2.6. This came with a new set of LabVIEW examples detailing how the API could be used within the LabVIEW environment. These examples have been added to since that release. […]
One of the new features in the recent v3.1 software release is a Fault Dictionary. This release cycle, one of our main goals was to make XJTAG more production friendly, and the fault dictionary provides a way of sharing relevant knowledge about a board between development and production engineers. […]
The latest version of XJTAG, version 3.1, is built using the .NET 4.0 framework. To use the latest version of the XJRunner Integration assembly within LabVIEW, LabVIEW must first be configured to accept .NET 4.0 assemblies. […]
A new major version of XJTAG – version 3.1 – is now available from our website for users who are in maintenance. […]
In XJTAG 2.6 we released a new .NET based XJRunner Integration API, replacing the old COM based API that was previously available. Version 2.6 and 2.7 continue to support the COM API, but do not install it by default. We recommend that any new development be done against the new .NET API. [...]
Version 2.6 introduced a new XJRunner integration API using the .NET framework along with reworked examples and LabVIEW VIs […]
From version 2.7 onwards XJTAG includes an integrated Schematic Viewer in XJDeveloper and XJRunner. If you have your boards’ schematics in PDF format you can take advantage of this new feature. […]
This is a common question during the development of a test system. The problem generally occurs when a board is first run, and stems from a slight misunderstanding of what Checkchain is designed to do. This article therefore attempts to explain the difference between the Checkchain function and all other tests, in order to explain [...]