Editors: Find and Replace enhancements
XJTAG 3.12 has extended the functionality of the Find and Replace dialog that is accessible when viewing XJEase or BSDL code files. […]
Categorising devices: Ignored, Unfitted, Excluded or Uncategorised?
(This updates an older article due to the addition of the Excluded category in XJTAG 3.12) One of the questions we are commonly asked by new users, and also by users who have not used XJTAG for a while and are coming back to it, is about the differences between device categorisations in XJDeveloper. [...]
Placing an Infineon Aurix™ TriCore™ TC3xx Microcontroller into Boundary Scan Mode
Some devices need more than a standard Test Reset sequence to enter the state when they behave as described in their BSDL file and boundary scan can run. Infineon’s Aurix TriCore TC3xx microcontroller family is one such group. […]
Revisions – part 2
This blog article is the second part of a three part series detailing the new Revisions feature in XJDeveloper 3.10. This article covers the setup process for a revisions project. […]
Using IIC to enable power supplies on your board
With the introduction of External Hardware per Subchain in XJDeveloper v3.9 it is possible to write a test that powers up your board using your XJLink2 to directly control the IIC pins before the JTAG chain is operable. Following is an example of how to set up this test in your project: [...]
External Hardware available per-Subchain (including testing without JTAG)
Version 3.9 of XJDeveloper introduces the ability to control which External Hardware machines operate in each Subchain, and integrates this control into the Dynamic Chains feature. This means that any test may now be configured to use just JTAG, just External Hardware, or a combination of both, to drive signals on the circuit under test. [...]
Editing configuration variables in XJTAG 3.9
Configuration variables in XJTAG allow settings to be configured for a device. For example the address of an IIC device may need to be defined. Configuration variables are associated with a test device file, and in previous versions of XJTAG were only available in device files from the XJEase library. From XJTAG 3.9 configuration variables [...]
Test Summary Report
In XJTAG 3.7, XJDeveloper can now generate a new style of DFT report. The Test Summary Report can be found via the DFT Reports menu item within the Tools menu, or in the Reports menu on the DFT Analysis screen (as are the other DFT reports) and contains up to four sections: [...]
Setting the Rules for Suggesting Unfitted Devices
With XJDeveloper 3.7 the user now has more control over how unfitted devices are suggested. The Unfitted Rules Dialog allows for the specific suggestion methods to be enabled or disabled, allowing for more accurate unfitted device suggestions. […]
More options for importing BOM information
The Bill of Materials, or BOM provides valuable information about the components in a netlist. This information is often key for project setups and, when available, is used by XJDeveloper to make project setup suggestions. This information is often taken from a separate BOM file or straight from a board’s netlist. With XJDeveloper 3.7 the [...]